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Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Jun 18, 2021. Publications

Abstract

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm−3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

M. P. Valdivia, D. Stutman, C. Stoeckl, W. Theobald,   G. W. Collins IV,     V. Bouffetier,   M. Vescovi,   C. Mileham,   I. A. Begishev,     S. R. Klein,   R. Melean,   S. Muller,   J. Zou,     F. Veloso,     A. Casner,     F. N. Beg, and   S. P. Regan

Review of Scientific Instruments 92, 065110 (2021); DOI: https://doi.org/10.1063/5.0043655

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